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Editorial
Peggy Aycinena
EDA Weekly
The Best of Times, The Worst of Time: Part 2
Since Part 1 of this article was published on October 13th, events have begun to overwhelm. The dramatic speed with which the …
Mark Gilbert
Careers Corner
Remember that kids' nursery rhyme LAYOFFS, FREEZES, GENERAL DOWNTURN… O MY?
Dr. Russ Henke & Dr. Jack Horgan
EDA & IP Commentary
Commentary: Electronics IP Industry - A November 2008 Update
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ARM Architecture Reference Manual (2nd Edition)
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Metric Driven Design Verification: An Engineer's and Executive's Guide to First Pass Success
, by Hamilton B. Carter; Shankar G. Hemmady.
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MT-005: Noise Power Ratio (NPR) – A 65-Year Old Telephone System Specification Finds New Life in Modern Wireless Applications
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